Equipments

• LCR bridge
• Magnetic Hysteresis Apparatus
• Ultrasonic Interferometer
• Dielectric constant Kit
• Specific heat Apparatus
• Hall probe Apparatus
• Digital Gauss meter
• Rockwell Hardness tester
• Hydraulic press pelletizer
• Substrate heater
• Conductivity Bridge
• DC Conductivity Apparatus
• Muffle furnace
• Planks constant Apparatus
• Band gap Apparatus
• Four probe Apparatus
• Digital Animo meter
• Strain Gauge -Cantilever type
• Lux Meter
• Sun meter
• Magnetic Stirrer
• Digital Temperature Controller
• Constant Temperature Bath
• Dual trace CRO
• Ultrasonic flaw detector
• Function generators
• Vacuum Desiccators
• Metallurgical Microscope

Capabilities

• Determination / measurement of:
• Dielectric constant
• Specific heat Constant
• Band gap
• Conductivity
• Planks constant
• Proximate analysis
• Efficacy
• Resistivity
• Semiconductor Properties
• Hysteresis losses
• Magnetic induction
• Wiind velocity
• Light intensity
• Solar radiation
• Ultrasonic velocity
• LCR values